A low-cost built-in self-test for CP-PLL based on TDC

Investigations for Minimum Invasion Digital Only Built-In "Ramp" Based Test Techniques for Charge Pump PLL's

Due to a number of desirable operational and design characteristics, CP-PLL’s (Charge Pump Phase locked loops) have, in recent years become a pervasive PLL architecture. CP-PLL architectures are exploited for a variety of applications such as on chip clock generation, CRC (clock recovery circuits) and Radio frequency synthesis applications. This paper describes a simple, digital only, minimally...

A New Built-in Self Test Scheme for Phase-Locked Loops Using Internal Digital Signals

Testing PLLs (phase-locked loops) is becoming an important issue that affects both time-to-market and production cost of electronic systems. Though a PLL is the most common mixed-signal building block, it is very difficult to test due to internal analog blocks and signals. In this paper, we propose a new PLL BIST (built-in self test) using the distorted frequency detector that uses only interna...

A Wideband Frequency Synthesizer for Built-in Self Testing of Analog Integrated Circuits

A Wideband Frequency Synthesizer for Built-in Self Testing of Analog Integrated Circuits. (August 2004) Wenjian Yan, B.S., Texas A&M University Chair of Advisory Committee: Dr. Jose Silva-Martinez The cost to test chips has risen tremendously. Additionally, the process for testing all functionalities of both analog and digital part is far from simple. One attractive option is moving some or all...

Low Power March Memory Test Algorithm for Static Random Access Memories (TECHNICAL NOTE)

Memories are most important building blocks in many digital systems. As the Integrated Circuits requirements are growing, the test circuitry must grow as well. There is a need for more efficient test techniques with low power and high speed. Many Memory Built in Self-Test techniques have been proposed to test memories. Compared with combinational and sequential circuits memory testing utilizes ...

A PLL based built-in self-test for MEMS sensors